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Agilent 4145B Semiconductor Parameter Analyzer


Agilent 4145B Semiconductor Parameter Analyzer
  • Fully automatic, high-speed DC characterization of semiconductor devices
  • Sourcing and measurement 50 fA to 100 mA and 1 mV to 100 V
  • Up to 1140 measurement and display points for precise measurement and analysis
  • Flexible graphic analysis for quick parameter extraction
  • Floppy disk drive stores of 240 user programs or 105 measurement results
  • HP-IB


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Agilent 4145B Semiconductor Parameter Analyzer
 
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